Electron microscope observation
Electron microscope is one of the commonly used tools for detecting the morphology of Regulating Microcapsules (Nano Level), mainly including scanning electron microscope (SEM) and transmission electron microscope (TEM). SEM generates secondary electron images by emitting electron beams to scan the surface of the sample, which can clearly observe the surface morphology, particle size and distribution of microcapsules, and whether there is agglomeration of microcapsules. TEM uses electron beams to penetrate the sample to form an image of the internal structure. It has unique advantages in observing the wall material thickness of the microcapsule, the interface between the core material and the wall material, and the uniformity of the internal structure. Through these two electron microscope techniques, detailed and accurate morphological information of Regulating Microcapsules (Nano Level) can be obtained.
Atomic force microscope detection
Atomic force microscope (AFM) is also an effective detection method. It obtains the morphological information of the sample by detecting the interatomic force between the probe and the sample surface. For Regulating Microcapsules (Nano Level), AFM can provide a three-dimensional morphological image of its surface at the atomic or molecular level, including detailed information such as the height and roughness of the microcapsules. Compared with electron microscopy, AFM does not require complex sample pretreatment and can be detected in an atmospheric environment, which is closer to the natural state of the sample, so it can more realistically reflect the surface morphology of microcapsules.
Dynamic light scattering analysis
Dynamic light scattering (DLS) technology is mainly used to measure the particle size and distribution of nanoparticles, but it can also indirectly reflect the morphological characteristics of microcapsules. When a laser beam is irradiated onto the suspension of Regulating Microcapsules (Nano Level), the scattered light will produce a Doppler frequency shift due to the Brownian motion of the microcapsules. By analyzing the fluctuation of the scattered light intensity, the particle size distribution of the microcapsules can be obtained. Although DLS cannot directly give the specific morphology of the microcapsules, information such as the uniformity of the particle size distribution can, to a certain extent, indicate whether the morphology of the microcapsules is regular and uniform, thereby providing auxiliary basis for judging the morphology of the microcapsules.
Assisted observation with an optical microscope
In some cases, an optical microscope can also be used for preliminary observation of the morphology of Regulating Microcapsules (Nano Level). Although the resolution of optical microscopes is limited and nano-level details cannot be directly observed, they can provide macroscopic morphological information such as shape, color, transparency, etc. for microcapsules or microcapsule aggregates with larger particle sizes. In addition, through some special optical microscope techniques, such as phase contrast microscopy and fluorescence microscopy, the contrast between microcapsules and the background can be enhanced, and the existence and distribution of microcapsules can be observed more clearly, providing a reference for further fine detection.
Through the comprehensive use of multiple detection technologies such as electron microscopy, atomic force microscopy, dynamic light scattering analysis, and optical microscopy, the morphology of Regulating Microcapsules (Nano Level) can be fully and accurately detected, providing important basic data for its performance research and application development.
